The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2023
Filed:
Apr. 04, 2021
Eric Swanson, Gloucester, MA (US);
Eric Swanson, Gloucester, MA (US);
Abstract
An interferometric measurement system includes ports configured to receive an optical signal from an optical source and an optical signal from a target. A photonic integrated circuit includes a variable delay configured to select between at least two optical paths from the input to an output such that the optical signal from the optical source passes to the output while experiencing an optical delay based on a selected one of the at least two optical paths where a loss of the optical signal from the optical source provided to the input that passes to the output is nominally the same for each of the at least two optical paths. An optical receiver is configured to receive the optical signal from the target and to receive the optical signal from the optical source that experiences the optical delay based on the selected one of the at least two optical paths and generates a corresponding electrical receive signal at an electrical output. A processor is configured to generate an interferometric measurement signal based on the receive signal.