The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Jan. 24, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Koudai Akashi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/00 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/007 (2013.01);
Abstract

A foreign matter detection device includes an ion sensor arranged in the interior of a feed axis motor. The ion sensor is formed so as to detect an ion contained in a cutting liquid. A machine controller judges whether an ion concentration is within a judgment range related to the cutting liquid based on output of the ion sensor, and judges that the cutting liquid has penetrated into the interior of the feed axis motor when the ion concentration is within the judgment range related to the cutting liquid.


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