The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Feb. 07, 2022
Ryoh Ishitsuka, Kanagawa, JP;
Kohta Aoyagi, Kanagawa, JP;
Ryosuke Ebinuma, Tokyo, JP;
Satoshi Nakayama, Kanagawa, JP;
Kimiharu Yamazaki, Kanagawa, JP;
Tohru Matsumoto, Kanagawa, JP;
Tatsuya Ishii, Kanagawa, JP;
Ryoh Ishitsuka, Kanagawa, JP;
Kohta Aoyagi, Kanagawa, JP;
Ryosuke Ebinuma, Tokyo, JP;
Satoshi Nakayama, Kanagawa, JP;
Kimiharu Yamazaki, Kanagawa, JP;
Tohru Matsumoto, Kanagawa, JP;
Tatsuya Ishii, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An image inspecting device includes an abnormality detector and circuitry. The abnormality detector is configured to detect an abnormality of an inspection object image. The circuitry is configured to set a non-detection area to be excluded from a detection object area within which the abnormality detector detects an image abnormality and set an area including an abnormality detection portion as the non-detection area when a detection result obtained by the abnormality detector satisfies a non-detection condition.