The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Apr. 11, 2022
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventor:
Toru Misaizu, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00013 (2013.01); H04N 1/00034 (2013.01); H04N 1/00045 (2013.01); H04N 1/00063 (2013.01); H04N 1/00068 (2013.01); H04N 1/00082 (2013.01); H04N 1/00724 (2013.01); H04N 1/00779 (2013.01); H04N 1/00819 (2013.01);
Abstract
An image inspection apparatus includes a processor configured to acquire printing data that is data as a base of an image to be printed, acquire read data that is data obtained by reading the image printed on a paper sheet, perform correction of a blur caused by floating of the paper sheet occurring in the reading of the image, on the read data, and inspect the image by comparing the printing data with the read data after the correction.