The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Oct. 28, 2020
Applicant:

Fannie Mae, Washington, DC (US);

Inventor:

Jay G. Rudrachar, Washington, DC (US);

Assignee:

Fannie Mae, Washington, DC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/5009 (2022.01); H04L 43/0817 (2022.01); H04L 43/06 (2022.01); H04L 43/045 (2022.01); H04L 41/16 (2022.01);
U.S. Cl.
CPC ...
H04L 41/5009 (2013.01); H04L 43/045 (2013.01); H04L 43/06 (2013.01); H04L 43/0817 (2013.01); H04L 41/16 (2013.01);
Abstract

Disclosed herein are systems, methods, and computer-readable media for enterprise information technology (IT) monitoring. In an embodiment, a method includes collecting system performance data for an enterprise computing environment. The method includes generating at least one cross-stack monitor schema. The cross-stack monitor schema includes at least one of shared services performance data, middleware performance data and infrastructure performance data corresponding to a particular application. The cross-stack monitor schema includes a technology stack component descriptor and a performance parameter. The technology stack component descriptor is identified based on applying reference data to the system performance data. The performance parameter is generated and populated based on the system performance data. The cross-stack monitor schema is linked to an electronic dashboard.


Find Patent Forward Citations

Loading…