The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Sep. 07, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jiseok Lee, Seoul, KR;

Hwangju Song, Suwon-si, KR;

Namyong Kim, Seoul, KR;

Jaeeun Yoon, Yongin-si, KR;

Sangmu Lee, Hwaseong-si, KR;

Sangwon Hwang, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 29/12 (2006.01); G11C 16/34 (2006.01); G11C 16/26 (2006.01); G11C 16/10 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 16/102 (2013.01); G11C 16/26 (2013.01); G11C 16/3495 (2013.01); G11C 29/12005 (2013.01);
Abstract

A storage device for performing a reliability check by using error correction code (ECC) data is provided. The storage device includes a memory controller configured to detect the number of errors of second read data read out by a second read operation, based on ECC data of first read data read by a first read operation of a memory device. The memory controller includes a memory check circuit that includes a counter configured to count states of memory cells, a comparator configured to compare respective count numbers of the states with one another, and a register configured to store the number of errors based on a result of the comparison.


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