The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Apr. 16, 2021
Nanolive SA, Tolochenaz, CH;
Yann Cotte, Lausanne, CH;
Sebastien Equis, Penthalaz, CH;
Bastian Dalla Piazza, Lausanne, CH;
Sorin Pop, Cuvat, FR;
Luca Clario, Saint-Sulpice, CH;
Christopher Tremblay, Eysins, CH;
Pierre-Alain Cotte, Amberg, DE;
NANOLIVE SA, Tolochenaz, CH;
Abstract
A microscopic object characterization system comprises a computer system, a microscope with a computing unit connected to the computer system, and an object characterization program executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of the microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on the refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object. The computer system further comprises a feedback interface configured for connection to one or more data servers in a network computing system, via a global communications network such as the internet, and configured to receive feedback data from the data servers for processing by the object characterization program to calibrate, refine or enhance a characterization of the features.