The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Feb. 18, 2020
Applicant:

Ecoatm, Llc, San Diego, CA (US);

Inventors:

John Silva, San Diego, CA (US);

Babak Forutanpour, San Diego, CA (US);

Assignee:

ecoATM, LLC, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/141 (2022.01); G02B 27/30 (2006.01); G06N 3/08 (2023.01); G06Q 30/0283 (2023.01); G06T 7/00 (2017.01); H04N 23/56 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/141 (2022.01); G02B 27/30 (2013.01); G06N 3/08 (2013.01); G06Q 30/0283 (2013.01); G06T 7/0004 (2013.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); H04N 23/56 (2023.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01);
Abstract

Systems and methods for evaluating the physical and/or cosmetic condition of electronic devices using machine learning techniques are disclosed. In one example aspect, an example system includes a kiosk that comprises an inspection plate configured to hold an electronic device, one or more light sources arranged above the inspection plate configured to direct one or more light beams towards the electronic device, and one or more cameras configured to capture at least one image of a first side of the electronic device. The system also includes one or more processors in communication with the one or more cameras configured to extract a set of features of the electronic device and determine, via a first neural network, a condition of the electronic device based on the set of features.


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