The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Jul. 23, 2020
Applicant:

Nalbi Inc., Seoul, KR;

Inventors:

Jae Young Yoo, Incheon, KR;

Sang Ho Lee, Daejeon, KR;

Assignee:

NALBI INC., Seoul, KR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06T 5/00 (2006.01); G06N 3/08 (2023.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06T 3/4046 (2013.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06T 5/003 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method of processing an image for improving image quality is provided. The method includes inputting an image into a first artificial neural network as an input variable to create a feature map and inputting an image into a second artificial neural network as an input variable to create an estimated class probability distribution map for each of frequency channels. Further, the method may comprise determining a class for each of the frequency channels on the basis of a probability distribution included in the estimated class probability distribution map, creating an estimated class map that includes a determined class, converting the estimated class map into an estimated frequency map, combining the estimated frequency map with the feature map to create a combined feature map, and inputting the combined feature map into a third artificial neural network as an input variable to create an output image.


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