The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Mar. 05, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Yohei Iizawa, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 20/00 (2019.01); G06F 18/214 (2023.01); G06V 10/774 (2022.01); G06V 10/98 (2022.01); G06V 20/00 (2022.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/214 (2023.01); G06T 7/001 (2013.01); G06T 7/0008 (2013.01); G06V 10/774 (2022.01); G06V 10/993 (2022.01); G06V 20/00 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

An image processing deviceincludes: a normal image acquisition meanswhich acquires a normal image including an object for inspection in a normal condition; an anomaly simulated image generation meanswhich inserts, into the normal image, a simulated image of an anomaly feature of the object for inspection in an anomaly condition to generate an anomaly simulated image; and a model learning meanswhich, using the normal image and the anomaly simulated image, learns a reproduction model for generating, from part of an image containing the object for inspection, a reproduction image is an image including at least a predetermined region of the object for inspection in which the predetermined region in a normal condition is reproduced.


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