The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Oct. 11, 2017
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Takumi Yamamoto, Tokyo, JP;

Keisuke Kito, Tokyo, JP;

Tomonori Negi, Tokyo, JP;

Kiyoto Kawauchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 21/56 (2013.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06F 21/56 (2013.01); H04L 63/1416 (2013.01); G06F 2221/033 (2013.01);
Abstract

An acquisition unit () acquires normal sample data and non-normal sample data. A model generation unit () generates a normal model representing the normal sample data. A change unit () generates a non-normal feature vector of the non-normal sample data, and generates a non-normal changed vector obtained by changing an element of the non-normal feature vector. When the non-normal changed vector and the normal model are similar to each other, a verification unit () executes a process using sample data represented by the non-normal changed vector. The verification unit () verifies whether an anomalous event is detected by a detection device. Upon verification that an anomalous event is not detected, the verification unit () determines whether an anomalous event is present, independently of the detection device. Upon determination that an anomalous event is present, the verification unit () stores the sample data represented by the non-normal changed vector as missed-detection sample data () in a storage unit ().


Find Patent Forward Citations

Yamamoto, Takumi. (2023). Sample data generation apparatus, sample data generation method, and computer readable medium (U.S. Patent No. 11797668). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11797668

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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