The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Jun. 30, 2022
Applicant:

Intuit Inc., Mountain View, CA (US);

Inventors:

Bei Huang, Mountain View, CA (US);

Nhung Ho, Redwood City, CA (US);

Assignee:

Intuit Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/35 (2019.01); G06F 16/33 (2019.01); G06F 16/36 (2019.01); G06F 16/34 (2019.01); G06F 16/338 (2019.01);
U.S. Cl.
CPC ...
G06F 16/35 (2019.01); G06F 16/338 (2019.01); G06F 16/3331 (2019.01); G06F 16/34 (2019.01); G06F 16/36 (2019.01);
Abstract

The invention relates to a method for mapping topics. The method includes obtaining terms, obtaining tokens from each term, and identifying a first and a second set of topics. Each of the topics represents one or more of the terms. The method further includes identifying first and second topic names for the first and the second sets of topics. For each topic, the tokens associated with the terms assigned to the topic are analyzed for relevance, and a token with a high relevance is selected as the topic name. The method also includes selecting one of the first and one of the second sets of topics to obtain first and second selected topics, determining, based on the one or more terms, a similarity value between each of the first and the second selected topics, and establishing a mapping between similar first and second selected topics.


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