The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Sep. 21, 2022
Applicant:
Nasdaq, Inc., New York, NY (US);
Inventors:
Xuyang Lin, Cambridge, MA (US);
Tudor Morosan, Toronto, CA;
Douglas Hamilton, Boston, MA (US);
Shihui Chen, Boston, MA (US);
Hyunsoo Jeong, Boston, MA (US);
Jonathan Rivers, Brighton, MA (US);
Leonid Rosenfeld, Brookline, MA (US);
Assignee:
NASDAQ, INC., New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/23 (2019.01); G06N 3/088 (2023.01); G06F 18/214 (2023.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06F 16/2358 (2019.01); G06F 18/2155 (2023.01); G06N 3/045 (2023.01); G06N 3/088 (2013.01);
Abstract
A computer system is provided for monitoring and detecting changes in a data generating processes, which may be under a multi-dimensional and unsupervised setting. A target dataset is split into paired subgroups by a separator and one or more detectors are applied to detect changes, anomalies, inconsistencies, and the like between the paired subgroups. Metrics may be generated by the detector(s), which are then passed to an evaluating system.