The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Nov. 18, 2019
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Christian Straub, Palo Alto, CA (US);

Hugh Zhang, Foster City, CA (US);

Diego Frabotta, Walnut Creek, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/368 (2013.01); G06F 11/3664 (2013.01);
Abstract

Implementations generally relate to software testing system and method for automatically generating, deploying, and monitoring software tests employed to test software applications and/or software process flows. In implementations, a system generates software application tests and varies such tests used based on several criteria including monitoring a software application processing defined inputs and outputs to determine which parts of the application are being tested, which parts of the software application are not being tested, user interactions, metadata, type of software application, use computing environment, etc. The system may be configured to adapt testing, either pre or post production, to allow, user interactions of one or more running software applications to be used to provide feedback on which additional tests to add and/or subtract automatically to testing sequences. Moreover, data gathering techniques such as crowd source data sampling, statistical sampling, and the like, may be employed as additional input to the system.


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