The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Mar. 26, 2020
Shenzhen Institutes of Advanced Technology, Guangdong, CN;
Shenzhen Institutes of Advanced Technology, Guangdong, CN;
Abstract
A method and an apparatus for generating time series data based on multi-condition constraints, and a medium are provided. The method include the following: a data repair request from a client is received, the data repair request including to-be-repaired data and condition information; normalization processing is performed on the to-be-repaired data to obtain normalized data, and tensor processing is performed on the condition information to obtain a feature label; a trained data repair model is called to perform repair processing on the normalized data according to the feature label to obtain first repaired data, the data repair model being obtained by training according to sample data, a first sample condition, real sample data and a second sample condition, and the sample data being noise data; and the first repaired data is sent to the client. By adopting embodiments of the application, rich features of the data can be acquired without a large amount of historical data or sample data with high matching degree as training basis, thus ensuring the accuracy and timing of the repaired data, and improving the repair efficiency and quality.