The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Nov. 30, 2021
Applicant:

Inspur Suzhou Intelligent Technology Co., Ltd., Jiangsu, CN;

Inventor:

Zhili Hou, Jiangsu, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/48 (2006.01); G06F 8/71 (2018.01); G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06F 9/4812 (2013.01); G06F 8/71 (2013.01); G06F 9/54 (2013.01);
Abstract

A method and apparatus for BMC-parameter configuring and taking-effect, a device and a medium. The method includes: after a first process receives a first external parameter, modifying a parameter-configuring state corresponding to the first external parameter of a database to be being-configured, and writing the first external parameter into the database, and triggering an interruption serving program at the same time; by using the interruption serving program, determining whether in the database there exists a parameter-configuring state that is being-configured; when in the database there exists the parameter-configuring state that is the being-configured, writing the first external parameter stored in the database into a configuration file; and after the first external parameter is successfully written into the configuration file, acquiring, from the database, a parameter taking-effect state corresponding to the first external parameter, and according to the parameter taking-effect state, performing taking-effect processing.


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