The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Jul. 20, 2022
Applicant:

Aible Inc., Pleasanton, CA (US);

Inventors:

Arijit Sengupta, San Francisco, CA (US);

Joseph Veltkamp, Pleasanton, CA (US);

Richard Cooke, Pleasanton, CA (US);

Robert Shaw, Pleasanton, CA (US);

Jonathan Wray, San Francisco, CA (US);

John Delaney, Foster City, CA (US);

Assignee:

AIBLE INC., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0482 (2013.01); G06F 3/04817 (2022.01); G06F 9/451 (2018.01); G06F 3/0484 (2022.01);
U.S. Cl.
CPC ...
G06F 3/04817 (2013.01); G06F 3/0482 (2013.01); G06F 3/0484 (2013.01); G06F 9/451 (2018.02); G06F 9/453 (2018.02);
Abstract

A first node having a first location in the first GUI and indicative of a first analytical task is provided in a first graphical user interface (GUI). A multi-step analytical process includes the first analytical task. Data is received characterizing a first user input indicative of selection of the first node. A first set of nodes is displayed in the first GUI. The first set of nodes are adjacent to the first node and are associated with a next step of the multi-step analytical process. The multi-step analytical process includes at least one of importing a dataset, building a model using the dataset, and/or deploying the model to operate on live data. Related apparatus, systems, techniques and articles are also described.


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