The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Feb. 08, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Wei Wang, Tokyo, JP;

Kojin Yano, Tokyo, JP;

Tetsushi Suzuki, Tokyo, JP;

Kenichirou Okada, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 15/02 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 23/021 (2013.01); G06N 20/00 (2019.01); G05B 15/02 (2013.01);
Abstract

A monitoring system that monitors a monitoring-target system is disclosed. The monitoring system includes one or more storage apparatuses that store a program, and one or more processors that operate according to the program. The one or more processors determine an estimated value of a monitoring-target response variable of the monitoring-target system on a basis of measurement data included in test data of the monitoring-target system and a causal structure model of the monitoring-target system. The one or more processors decide whether an abnormality has occurred in the monitoring-target system on a basis of a result of a comparison between a measurement value of the monitoring-target response variable included in the test data, and the estimated value.


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