The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Mar. 15, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takashi Hamaguchi, Tokyo, JP;

Tadashi Fujieda, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4099 (2006.01); B33Y 50/00 (2015.01); B22F 10/80 (2021.01); B33Y 50/02 (2015.01); G06F 30/00 (2020.01); G06F 30/20 (2020.01); B22F 10/28 (2021.01); G06F 113/10 (2020.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); B22F 10/80 (2021.01); B33Y 50/00 (2014.12); B33Y 50/02 (2014.12); G06F 30/00 (2020.01); G06F 30/20 (2020.01); B22F 10/28 (2021.01); G05B 2219/49023 (2013.01); G06F 2113/10 (2020.01); G06F 2119/18 (2020.01);
Abstract

When the temperature history in a fine mesh is obtained for the entire modeled object, it takes a huge amount of time in calculation. In order to solve the problem, An additive-manufactured object design supporting device, comprising: an analysis unit configured to analyze a modeling process of a macro-region and a micro-region by using a product shape, a material condition, and a modeling condition of a modeled object as input; a temperature history extraction unit configured to extract, from a temperature analysis result of the macro-region, a local temperature history by referring to a database that stores a temperature history of the micro-region; a mapping unit configured to map a structure distribution obtained from a temperature history distribution of the modeled object to the modeled object; and an extraction unit configured to extract a defective structure that does not satisfy a structure condition by using an allowable structure condition as input.


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