The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Aug. 27, 2021
Applicant:

Fujifilm Business Innovation Corp., Tokyo, JP;

Inventors:

Kenta Ogata, Kanagawa, JP;

Kouhei Yukawa, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 5/00 (2006.01); B41J 11/00 (2006.01); G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/5029 (2013.01); B41J 11/009 (2013.01); G03G 2215/00637 (2013.01); G03G 2215/00717 (2013.01); G03G 2215/00742 (2013.01); G03G 2215/00763 (2013.01);
Abstract

A measurement device includes a measurement unit that measures a physical property of a measurement target by causing the measurement target to vibrate through an application of an ultrasonic wave, the measurement unit including a first mode that measures the physical property using a first burst wave sensitive in a first predetermined range of physical property values and a second mode that measures the physical property using a second burst wave sensitive in a second range of physical property values different from the first range, and a control unit that controls the measurement unit to execute at least one of the first mode and the second mode.


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