The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Aug. 03, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Ryota Sato, Tochigi, JP;
Seiji Kuwabara, Tochigi, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Alight scanning apparatus according to the present invention includes a deflecting unit configured to deflect a light flux to scan a scanned surface in a main scanning direction, and an imaging optical system configured to guide the light flux deflected by the deflecting unit to the scanned surface and to have different partial magnifications in the main scanning direction between an on-axis image height and an outermost off-axis image height. A ratio of a reflectivity at a first outermost off-axis deflection point on one side with respect to an on-axis deflection point on a deflecting surface of the deflecting unit to that at the on-axis deflection point, and a ratio of the reflectivity at a second outermost off-axis deflection point on the other side with respect to the on-axis deflection point on the deflecting surface to that at the on-axis deflection point are each appropriately set.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile