The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

May. 05, 2023
Applicant:

Mloptic Corp, Redmond, WA (US);

Inventors:

Pengfei Wu, Bellevue, WA (US);

Wei Zhou, Sammamish, WA (US);

Assignee:

MLOptic Corp., Redmond, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0172 (2013.01);
Abstract

A method for providing a virtual distance of a device under test using a system including a light source, a wedge shear plate, a first detector and a second detector, wherein the wedge shear plate is disposed between the device under test and the light source, the first detector configured for receiving a first interference pattern formed as a result of the light source being disposed through and reflected by the wedge shear plate, and the second detector configured for receiving a second interference pattern formed as a result of the light source being disposed through and reflected by the wedge shear plate, the method including obtaining the first interference pattern using the first detector, obtaining the second interference pattern using the second detector and determining the virtual distance based on the first interference pattern, the second interference pattern, the light source and the wedge shear plate.


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