The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

May. 08, 2018
Applicant:

Landmark Graphic Corporation, Houston, TX (US);

Inventors:

Masoud Alfi, College Station, TX (US);

Travis St. George Ramsay, Hockley, TX (US);

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/52 (2006.01); E21B 47/12 (2012.01); G01V 1/50 (2006.01);
U.S. Cl.
CPC ...
G01V 1/52 (2013.01); E21B 47/12 (2013.01); G01V 1/50 (2013.01); G01V 2210/161 (2013.01); G01V 2210/6224 (2013.01); G01V 2210/6226 (2013.01); G01V 2210/66 (2013.01);
Abstract

An information processing system having a processor and a memory device coupled to the processor, wherein the memory device includes a set of instruction that, when executed by the processor, cause the processor to receive a multi-dimensional grid of acoustic or elastic impedances determined from seismic survey data associated with a subterranean formation, receive elastic property data that describes elastic property characteristics used to sort pseudo-components, and wherein the respective pseudo-components are formed of a combination of two or more lithologies. The instructions, when executed by the processor, further cause the processor to define select design variables using the impedance arrays, perform optimization operations for optimizing select design variables by applying the elastic property data as a part of a constitutive relation, and output a distribution of the pseudo-components to characterize volumetric concentrations of spatially grouped lithologies in a control volume of the subterranean formation.


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