The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Nov. 04, 2020
Applicants:

Consejo Superior DE Investigaciones Científicas, Madrid, ES;

Universitat DE Valencia, Valencia, ES;

Inventors:

Gabriela Dolores Llosá Llácer, Valencia, ES;

Carlos Lacasta Llácer, Valencia, ES;

John Barrio Toala, Valencia, ES;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/02 (2006.01); A61N 5/10 (2006.01); G01T 1/202 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
G01T 1/02 (2013.01); A61N 5/1071 (2013.01); G01T 1/2023 (2013.01); G01T 1/24 (2013.01); A61N 2005/1087 (2013.01);
Abstract

A device for detecting photons and charged particles includes a first photon-detecting panel, which causes a Compton scattering of incident radiation with charged particles, such that the wavelength thereof increases, losing part of their energy, generating a signal. A central charged particle-detecting panel, following the first photon-detecting panel on a side opposite that of the incident radiation, identifies charged particles generated in the first photon-detecting panel, generating a signal. A second photon-detecting panel, follows the central charged particle-detecting panel on a side opposite that of the first photon-detecting panel. Scattered photons and/or charged particles are generated in the first photon-detecting panel interact, generating a signal.


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