The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Jul. 12, 2019
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventor:

Yongquan Ye, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/563 (2006.01); A61B 5/055 (2006.01); G01R 33/56 (2006.01); G16H 30/40 (2018.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/563 (2013.01); A61B 5/055 (2013.01); G01R 33/5608 (2013.01); G01R 33/5611 (2013.01); G16H 30/40 (2018.01);
Abstract

A system is provided in the present disclosure. The system may acquire a first set of echo signals and a second set of echo signals relating to a subject. The first and the second set may be generated by using an MR scanner to execute a first acquisition and a second acquisition on the subject, respectively. The first acquisition may include at least a first repetition and a second repetition with different repetition times. Each of the first and second repetitions may have a first flip angle. The second acquisition may include at least a third repetition and a fourth repetition with different repetition times. Each of the third repetition and the fourth repetition may have a second flip angle different from the first flip angle. The system may also perform a measurement on the subject based on at least one of the first set or the second set.


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