The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Oct. 05, 2021
Applicant:
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Inventors:
Pauli Mark Kehayias, Albuquerque, NM (US);
Ezra Bussmann, Albuquerque, NM (US);
Tzu-Ming Lu, Albuquerque, NM (US);
Andrew Mounce, Albuquerque, NM (US);
Assignee:
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/32 (2006.01); G06V 20/00 (2022.01); G01R 33/035 (2006.01); G06F 18/213 (2023.01);
U.S. Cl.
CPC ...
G01R 33/326 (2013.01); G01R 33/0354 (2013.01); G06F 18/213 (2023.01); G06V 20/95 (2022.01);
Abstract
A physically unclonable function (PUF) and a method of reading it are provided. The PUF is constituted by a microfabricated array of randomly polarized micromagnets disposed on a substrate. The PUF can be read by creating a magnetization map of the PUF from the signal output of a quantum diamond microscope (QDM) and converting the magnetization map to a numerical sequence.