logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11796595 B1

PDFFull Text
Date of Patent:
Oct. 24, 2023

Filed:

Jul. 10, 2018

Apparatus and method for inspecting defect of secondary battery

Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Joon Sup Kang, Daejeon, KR;

Sung Tae Kim, Daejeon, KR;

Nak Gi Sung, Daejeon, KR;

Joon Sung Bae, Daejeon, KR;

Assignee:

LG ENERGY SOLUTION, LTD., Seoul, KR;

Attorney:

Birch, Stewart, Kolasch & Birch, LLP

Primary Examiner:

Lee E Rodak

Assistant Examiner:

Trung Q Nguyen

Int. Cl.
CPC ...
G01R 31/36 (2020.01); H01M 10/42 (2006.01); G01R 31/389 (2019.01);
U.S. Cl.
CPC ...
G01R 31/3644 (2013.01); G01R 31/389 (2019.01); H01M 10/4285 (2013.01);
Abstract

An apparatus for inspecting defects of a secondary battery having a pair of pressing jigs which press an outer surface of an electrode or a pouch accommodating the electrode assembly in directions corresponding to each other and on which a plurality of protrusions protrude from pressing surfaces and a measurement unit measuring one or more of current, a voltage, and resistance of the electrode assembly when the electrode assembly is pressed by the plurality of protrusions of the pair of pressing jigs is provided.

Find Patent Forward Citations

Kang, Joon. (2023). Apparatus and method for inspecting defect of secondary battery (U.S. Patent No. 11796595). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11796595

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…