The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Apr. 23, 2018
Applicant:

The Board of Regents of the University of Oklahoma, Norman, OK (US);

Inventors:

Jorge Luis Salazar Cerreno, Norman, OK (US);

Alessio Mancini, Norman, OK (US);

Boon Leng Cheong, Norman, OK (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01S 7/40 (2006.01); H01Q 1/42 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0878 (2013.01); G01S 7/40 (2013.01); G01S 7/4008 (2013.01); H01Q 1/421 (2013.01); H01Q 1/422 (2013.01);
Abstract

A probe is described. The probe includes a probe antenna, a transmitter, a receiver and circuitry including hardware. The probe antenna is constructed of a dielectric material connected to a waveguide, the probe antenna has a far field region. The transmitter is coupled to the probe antenna. The receiver is coupled to the probe antenna. The hardware is configured to communicate with the transmitter to enable the transmitter to direct a pulse of electromagnetic energy to the probe antenna and to receive a reflection signal from the receiver, the hardware is configured to determine a material property of a material within the far-field region of the probe antenna by analyzing the reflection signal.


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