The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Nov. 04, 2022
Applicant:
Trustees of Tufts College, Medford, MA (US);
Inventors:
Igor Sokolov, Medford, MA (US);
Milos Miljkovic, Medford, MA (US);
Assignee:
Trustees of Tufts College, Medford, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/04 (2010.01); G06V 20/69 (2022.01); G01N 33/49 (2006.01); G01Q 60/34 (2010.01); G01Q 60/42 (2010.01); G01N 33/493 (2006.01); G01N 33/574 (2006.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G01Q 30/04 (2013.01); G01N 33/493 (2013.01); G01N 33/57488 (2013.01); G01Q 60/34 (2013.01); G01Q 60/42 (2013.01); G06V 10/764 (2022.01); G06V 20/698 (2022.01);
Abstract
A method comprises using an atomic-force microscope, acquiring a set of images associated with surfaces, and, using a machine-learning algorithm applied to the images, classifying the surfaces. As a particular example, the classification can be done in a way that relies on surface parameters derived from the images rather than using the images directly.