The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Dec. 17, 2021
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Shinji Miyauchi, Kyoto, JP;
Susumu Adachi, Kyoto, JP;
Asaka Kohiyama, Kyoto, JP;
Takuro Izumi, Kyoto, JP;
Takashi Omori, Kyoto, JP;
Kenji Sato, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2018.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2076 (2013.01); G01N 23/223 (2013.01); G01N 2223/076 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/316 (2013.01); G01N 2223/3306 (2013.01);
Abstract
A spectroscopic element and a detector are disposed along a circumference of one Rowland circle. The spectroscopic element has a spectral surface whose length, measured along the Rowland circle, is shorter than a length in the Rowland circle plane, of an irradiation surface irradiated with excitation beams emitted to a sample holder. The spectroscopic element and the sample holder are disposed to separate a group of characteristic X-rays within a common spectral range of the spectroscopic element.