The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Dec. 07, 2021
Applicant:
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Inventors:
Liu-Bin Hu, Shenzhen, CN;
Wei Yang, Shenzhen, CN;
Assignee:
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G06T 7/0006 (2013.01); G01N 2021/8887 (2013.01); G06T 2207/30108 (2013.01);
Abstract
A device to detect defects in a finished surface by analyzing images thereof includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, and a light source assembly. The processor is used to connect to a camera assembly, and preprocess image obtained of the front of the product to obtain a detection of any defects of the front of the product.