The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Aug. 18, 2020
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Taro Imagawa, Osaka, JP;

Hiroya Kusaka, Hyogo, JP;

Akihiro Noda, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01B 11/30 (2013.01); G01N 21/8851 (2013.01);
Abstract

An inspection device that inspects a structure with a crack, including: an obtainer that obtains images of the structure captured at mutually different times while the structure is subjected to varying loads; a crack detector that detects a crack on a surface of the structure in each image; a motion estimator that divides each image into blocks having a predetermined size, and derives motion vectors of the blocks based on a positional relation between a position of each block relative to a reference in a first image and a position of each block relative to the reference in a second image, the reference being a tip of the crack detected, the first and second images being included in the images; and an inspector that determines safety of the structure based on a difference between ones of the motion vectors of symmetric positions with respect to the crack.


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