The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Oct. 15, 2019
Applicant:

Polyvalor, Limited Partnership, Montreal, CA;

Inventors:

Frederic Leblond, Terrebonne, CA;

Francois Daoust, Pointe-Claire, CA;

Sandryne David, Montreal, CA;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); A61B 5/0075 (2013.01);
Abstract

There is described a method for performing a Raman spectroscopy measurement on a sample. The method generally has sequentially illuminating an area of said sample with first and second excitation signals, said first excitation signal being slightly spectrally spaced-apart from said second excitation signal, resulting in said area sequentially emitting first and second emission signals; upon receiving said first emission signal, measuring a first intensity value being indicative of optical intensity of said first emission signal within at least a detection band; upon receiving said second emission signal, measuring a second intensity value being indicative of optical intensity of said second emission signal within said detection band; and performing said Raman spectroscopy measurement by comparing said first intensity value to said second intensity value.


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