The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Feb. 25, 2021
Applicant:

The Wave Talk, Inc., Daejeon, KR;

Inventors:

Young Dug Kim, Gyeonggi-do, KR;

Kyoung Man Cho, Seoul, KR;

Assignee:

THE WAVE TALK, INC., Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 21/27 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); G01N 15/1012 (2013.01); G01N 15/1459 (2013.01); G01N 21/278 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1018 (2013.01);
Abstract

The present invention relates to a test sample receiving block and a microbial detection apparatus using the same. The test sample receiving block may include a sample receiving block having a sample groove portion formed therein, the sample groove portion containing the sample so that a light emission module emits light to the sample and a sensor module can detect a speckle generated when the emitted light is scattered by motion of bacteria or microbes contained in the sample, wherein the sample receiving block is surface-treated to increase an optical path of light reaching the sensor module when the emitted light is reflected or scattered by the sample accommodated in the sample groove portion, so that a pattern is formed on a surface of the sample groove portion.


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