The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Jun. 06, 2023
Xinjiang Technical Institute of Physics and Chemistry, Cas, Urumqi, CN;
Linjun Li, Urumqi, CN;
Shilie Pan, Urumqi, CN;
Yu Zhou, Urumqi, CN;
Xiaoming Duan, Urumqi, CN;
Qianqian Hao, Urumqi, CN;
Yingjie Shen, Urumqi, CN;
Xin He, Urumqi, CN;
Hongsheng Shi, Urumqi, CN;
Zheng Cui, Urumqi, CN;
Abstract
A method for measuring multiple parameters of mixed gases based on broadband infrared light source is provided, including: filtering a broadband infrared laser, and forming a laser beam including three narrow-linewidth wavelengths; dividing the laser beam into a first sub-laser beam and a second sub-laser beam; focusing and transmitting the first sub-laser beam to a gas sample cell; focusing and transmitting the first sub-laser beam to a first reflector; reflecting and transmitting the first sub-laser beam; reflecting and transmitting the second sub-laser beam to the second beam splitter; combing the first sub-laser beam transmitted by the second beam splitter and the second sub-laser beam reflected by the second beam splitter, measuring the multiple parameters; combining and transmitting the second sub-laser beam transmitted by the second beam splitter and the first sub-laser beam reflected by the second beam splitter to a spectrometer for measuring concentrations the mixed gases.