The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Jun. 22, 2017
Applicant:

Universiteit Maastricht, Maastricht, NL;

Inventors:

Franciscus Johannes Theresia Nijpels, Veldwezelt, BE;

Raimond Ravelli, Maastricht, NL;

Jacobus Peter Johannes Peters, Amsterdam, NL;

Iglesias Carmen Lopez, Maastricht, NL;

Assignee:

UNIVERSITEIT MAASTRICHT, Maastricht, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/42 (2006.01); G01N 1/28 (2006.01); H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
G01N 1/42 (2013.01); G01N 1/2813 (2013.01); H01J 37/20 (2013.01); F25D 2400/30 (2013.01); H01J 2237/2001 (2013.01);
Abstract

The invention relates to a method of and apparatus for preparing a sample for imaging or diffraction experiments under cryogenic conditions, comprising the steps of applying a sample to sample carrier, such as a film on a support, in particular a grid comprising such a film on a support, or removing residual medium, typically liquid, from an incubated sample on a film on a support, and vitrifying the sample. The sample is vitrified by directing a jet of liquid coolant to the center of the film and onto the sample.


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