The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Aug. 15, 2022
Applicant:

Leica Geosystems Ag, Heerbrugg, CH;

Inventors:

Heinz Lippuner, Rebstein, CH;

Urs Vokinger, Au, CH;

Knut Siercks, Mörschwil, CH;

Assignee:

LEICA GEOSYSTEMS AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 1/00 (2006.01); G01B 21/04 (2006.01); G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
G01C 1/00 (2013.01); G01B 21/045 (2013.01); G01D 5/3473 (2013.01);
Abstract

Measurement method where a code projection which is dependent on a three-dimensional position of a code carrier relative to a sensor arrangement is generated on a sensor arrangement, and at least part of the code projection is captured. An angular position of the code carrier with reference to the defined axis of rotation is ascertained and a current measurement position of the measurement component relative to a base is determined, wherein, a position value for at least one further degree of freedom of the code carrier relative to the sensor arrangement is ascertained on the basis of the code projection and is taken into account to determine the current measurement position, and a relative position of the connecting element with respect to the holder and/or the deformation thereof is determined from the position value in the form of a change in shape or size.


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