The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Jul. 23, 2019
Applicant:

Skyverse Technology Co., Ltd., Guangdong, CN;

Inventors:

Lu Chen, Guangdong, CN;

Le Yang, Guangdong, CN;

Yanzhong Ma, Beijing, CN;

Chaoqian Zhang, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 9/02015 (2022.01); G01B 11/00 (2006.01); G01B 11/03 (2006.01); G01B 11/06 (2006.01); G01B 9/0209 (2022.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 9/0209 (2013.01); G01B 9/02015 (2013.01); G01B 11/002 (2013.01); G01B 11/03 (2013.01); G01B 11/06 (2013.01); G01B 11/2441 (2013.01); G01B 2210/56 (2013.01);
Abstract

A light emitting device, an optical detection system, an optical detection device and an optical detection method, the light emitting device comprising: a light source (), and an aperture limiting unit () located on an emergent light path of the light source (); the light source () is used to emit light; and the aperture limiting unit () is used to limit the aperture of light emitted by the light source () when a current detection area of an object to be tested () has a high aspect ratio structure so as to block a portion of light having a large included angle with the normal direction of the object to be tested ().


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