The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Jun. 14, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Naoto Abe, Tokyo, JP;

Hitoshi Seshimo, Tokyo, JP;

Hiroshi Konishi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/021 (2018.01); H04W 4/38 (2018.01); H04W 48/02 (2009.01); H04W 72/0446 (2023.01);
U.S. Cl.
CPC ...
H04W 4/021 (2013.01); H04W 4/38 (2018.02); H04W 48/02 (2013.01); H04W 72/0446 (2013.01);
Abstract

A collection device includes a deciding unit that, on the basis of data obtained in advance for each area, decides a collection interval and a collection time for each of the areas, a communication unit that acquires a current position from each of measurement terminals, and an allocating unit that, in a case where there is an area corresponding to the current position acquired regarding each of the measurement terminals, calculates a slot count of slots regarding which the collection interval and the collection time are cyclically allocated, on the basis of the collection interval and the collection time of this area, and allocates slot Nos. of an amount equivalent to the slot count, to any of the measurement terminals present in this area, by a predetermined method. The communication unit transmits, to each of the measurement terminals to which slot Nos. are allocated, the collection interval of the area in which the measurement terminal is present, the collection time of this area, the slot count of this area, and the slot No. allocated to the measurement terminal, and receives measurement information including measurement data measured on the basis of the collection interval and the collection time, from each of the measurement terminals to which slot Nos. are allocated.


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