The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Jun. 01, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Sze Yang Dennis Ng, Sunnyvale, CA (US);

Jr-Yi Shen, Saratoga, CA (US);

Harish Rajagopalan, San Jose, CA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/10 (2015.01); H04B 7/0408 (2017.01); H01Q 15/14 (2006.01);
U.S. Cl.
CPC ...
H04B 17/101 (2015.01); H01Q 15/14 (2013.01); H04B 7/0408 (2013.01);
Abstract

A testing system may include a test electronic device having a test antenna disposed in a first signal path of a first antenna array of an electronic device. The test antenna may receive a first signal from the first antenna array. The testing system may also include a reflector disposed in a second signal path of a second antenna array of the electronic device. The reflector may reflect a second signal from the second antenna array to the test antenna. The reflector may include a flat, parabolic, or elliptical curvature that reflects a radio frequency signal emitted by the second antenna array to the test antenna.


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