The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Jun. 25, 2021
Applicant:

Ngk Insulators, Ltd., Nagoya, JP;

Inventors:

Yuji Hori, Owariasahi, JP;

Takahiro Yamadera, Nagoya, JP;

Assignee:

NGK INSULATORS, LTD., Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 9/02 (2006.01); H03H 3/08 (2006.01); H10N 30/072 (2023.01);
U.S. Cl.
CPC ...
H03H 9/02559 (2013.01); H03H 3/08 (2013.01); H03H 9/02834 (2013.01); H10N 30/072 (2023.02);
Abstract

A bonded body includes a supporting substrate; a piezoelectric material substrate composed of a material selected from the group consisting of lithium niobate, lithium tantalate and lithium niobate-lithium tantalate; and a bonding layer bonding the supporting substrate and the piezoelectric material substrate and contacting a main surface of the piezoelectric material substrate. It is provided that at least one of a bonding surface of the supporting substrate and a bonding surface of the piezoelectric material substrate is measured by X-ray reflectivity method and that 1 is assigned to a signal intensity in the case of total reflection. A relative intensity I of a reflected light from the bonding surface is approximated by the following formula (1) in a range of 1.0×10or larger and 1.0×10or smaller.(2θ)  (1)(θ represents an incident angle of an X-ray with respect to the bonding surface, a is 1.0×10or larger and 2.0×10or smaller, and b is 5.0 or larger and 9.0 or smaller.)


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