The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Aug. 27, 2021
Applicant:

The Boeing Company, Chicago, IL (US);

Inventor:

Mark E. Hulscher, Seattle, WA (US);

Assignee:

The Boeing Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 13/52 (2006.01); H01R 11/18 (2006.01); H01R 11/00 (2006.01);
U.S. Cl.
CPC ...
H01R 13/521 (2013.01); H01R 11/00 (2013.01); H01R 11/18 (2013.01); H01R 13/5205 (2013.01); H01R 13/5219 (2013.01);
Abstract

Apparatus and methods for inserting and retention testing an electrically conductive contact in an electrical connector. The method includes the following steps: manually partially inserting the contact into a hole formed inside the electrical connector; inserting the contact further into the hole by pushing the contact along an axis using an insertion tip that is aligned with the axis and that displaces in a first direction along the axis during inserting; and after inserting the contact further into the hole, testing retention of the contact inside the electrical connector by pushing the contact along the axis using a test probe that is aligned with the axis and that displaces in a second direction opposite to the first direction during retention testing. The force exerted by the test probe on the contact is less than a specified contact retention force. The method further includes generating an alert signal if the test probe displaces along the axis in the second direction by more than a specified distance during retention testing.


Find Patent Forward Citations

Loading…