The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Sep. 02, 2021
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Evan R. Williams, Oakland, CA (US);

Conner C. Harper, Albany, CA (US);

Andrew G. Elliott, Berkeley, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/02 (2006.01); H01J 49/00 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/025 (2013.01); H01J 49/0031 (2013.01); H01J 49/0036 (2013.01); H01J 49/4245 (2013.01);
Abstract

Systems and multiplexing methods for measuring the mass of multiple large molecules simultaneously using multiple ion trapping with charge detection mass spectrometry (CDMS) are described. The methods trap ions with a broad range of energies that decouple ion frequency and m/z measurements allowing energy measurements of each ion throughout the acquisition. The ion energy may be obtained from the ratio of the intensity of the fundamental to the second harmonic frequencies of the periodic trapping oscillation making it possible to measure both the m/z and charge of each ion. Because ions with the exact same m/z but different energies appear at different frequencies, the probability of ion-ion interference is significantly reduced. By maximizing the decoupling of ion m/z from frequency, the rate of signal overlap is significantly reduced making it possible to trap more ions and substantially reduce analysis time.


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