The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Sep. 22, 2021
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Baochang Han, Shenzhen, CN;

Xiao Han, Shenzhen, CN;

Yong Chen, Shenzhen, CN;

Peng Yang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G06T 7/62 (2017.01); G02B 21/34 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G06V 20/695 (2022.01); G02B 21/34 (2013.01); G02B 21/367 (2013.01); G06T 7/62 (2017.01); G06T 2207/10056 (2013.01);
Abstract

Embodiments of the present disclosure provide an image processing method based on artificial intelligence (AI) and an image processing system. The method includes: obtaining a feature recognition result of an image by performing image processing on the image to recognize a feature of the image and the image being obtained by performing image acquisition on a section of a patient using a digital slide scanner to generate a whole slide image (WSI) as the image; determining an imaging area of the section within a field of view of an eyepiece of a microscope with which real-time imaging is performed on the section; determining, within the image, an image area corresponding to the imaging area of the section and acquiring, from the feature recognition result of the image, a target feature recognition result of the image area; and superimposing the target feature recognition result on the imaging area of the section.


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