The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Jun. 22, 2021
Applicant:

Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;

Inventor:

Yuchen Yuan, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/77 (2017.01); G06N 3/04 (2023.01); G06V 20/40 (2022.01); G06V 20/52 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 40/10 (2022.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06N 3/04 (2013.01); G06T 7/77 (2017.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 20/46 (2022.01); G06V 20/52 (2022.01); G06V 40/103 (2022.01); G06T 2207/10016 (2013.01); G06T 2207/30241 (2013.01); G06V 2201/07 (2022.01);
Abstract

Embodiments of the present disclosure provide a method and apparatus for detecting a target object, an electronic device, and a computer readable storage medium. The method may include: acquiring a to-be-detected image; processing the to-be-detected image using an object detection model including a deformable convolutional layer to obtain an offset prediction result of the deformable convolutional layer; and adjusting a size of an anchor point using the offset prediction result, and determining position information of the target object in the to-be-detected image using the anchor point of the adjusted size.


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