The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Dec. 04, 2020
Applicants:

The Johns Hopkins University, Baltimore, MD (US);

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Jeffrey H. Siewerdsen, Baltimore, MD (US);

Pengwei Wu, Baltimore, MD (US);

Niral M. Sheth, Baltimore, MD (US);

Bjoern W. Kreher, Erlangen, DE;

Assignees:

THE JOHNS HOPKINS UNIVERSITY, Baltimore, MD (US);

SIEMENS HEALTHCARE GMBH, Erlangen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 6/12 (2006.01); A61B 6/00 (2006.01); G06T 7/70 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 6/12 (2013.01); A61B 6/4441 (2013.01); A61B 6/4447 (2013.01); A61B 6/5205 (2013.01); A61B 6/5258 (2013.01); G06T 7/70 (2017.01); G06T 11/005 (2013.01); G06T 11/006 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A system and method for metal artifact avoidance in 3D x-ray imaging is provided. The method includes determining a 3D location of metal in an object or volume of interest to be scanned; estimating a source-detector orbit that will reduce the severity of metal artifacts; moving an imaging system to locations consistent with the source-detector orbit that was estimated; and scanning the object according to the source-detector orbit.


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