The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jun. 07, 2022
Applicant:
Flir Systems Ab, Täby, SE;
Inventors:
Ariel Nagauker, Rosh Ha'Ayin, IL;
Chen Yahudayin, Rosh Ha'Ayin, IL;
Assignee:
FLIR Systems AB, Täby, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 5/33 (2023.01); G06T 17/00 (2006.01); G01J 5/10 (2006.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); G01J 5/10 (2013.01); G06T 17/00 (2013.01); H04N 5/33 (2013.01); G01J 2005/0077 (2013.01); G01J 2005/106 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/30116 (2013.01);
Abstract
Techniques for facilitating testing analytics of imaging systems and methods using molds are provided. In one example, a system includes a mold temperature controller configured to apply a thermal signature to a mold of a target. The system further includes a focal plane array configured to capture an infrared image of the mold. The system further includes an image analytics device configured to determine thermal analytics associated with the mold based on the infrared image. Related devices and methods are also provided.