The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Apr. 17, 2019
Applicant:
Shimadzu Corporation, Koyo, JP;
Inventors:
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 29/06 (2006.01); G01N 29/24 (2006.01); G06F 3/14 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 29/0663 (2013.01); G01N 29/2418 (2013.01); G06F 3/14 (2013.01);
Abstract
This defect inspection apparatus () is provided with an excitation unit (), a laser illumination unit (), an interference unit (), an imaging unit (), and a control unit () for generating a moving image () related to the propagation of an elastic wave of an inspection target (). The control unit is configured to perform control to display an identified measurement inappropriate region () in such a manner as to be distinguishable from a measurement appropriate region () in which the vibration state has been correctly acquired in the moving image ().