The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jan. 03, 2020
Applicant:
Sualab Co., Ltd., Seoul, KR;
Inventors:
Kiyoung Song, Seoul, KR;
Hunmin Cho, Seoul, KR;
Assignee:
SuaLab Co., Ltd., Seoul, KR;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/40 (2022.01); G01N 21/88 (2006.01); G01N 21/89 (2006.01); H04N 7/18 (2006.01); H04N 23/56 (2023.01); H04N 23/80 (2023.01); H04N 23/90 (2023.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 21/8806 (2013.01); G01N 21/8901 (2013.01); G06V 10/40 (2022.01); H04N 7/181 (2013.01); H04N 23/56 (2023.01); H04N 23/80 (2023.01); H04N 23/90 (2023.01); G01N 2033/0078 (2013.01); G06T 2207/10152 (2013.01);
Abstract
The defect inspection device includes a robot arm including a hold unit for holding an object and a driving unit for moving the object; a first camera unit photographing an exterior of the object; an illumination unit irradiating light to the exterior of the object; and a control unit determining whether there is a defect in the object based on an image of the object photographed by the first camera unit.
Song, Kiyoung. (2023). Defect inspection device (U.S. Patent No. 11790512). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11790512
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile