The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jun. 06, 2019
Applicant:
Carl Zeiss Jena Gmbh, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/70 (2017.01); G01M 11/02 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01M 11/0221 (2013.01); G01M 11/0264 (2013.01); G01M 11/0278 (2013.01); G06T 5/007 (2013.01); G06T 5/50 (2013.01); G06T 7/70 (2017.01); G06T 2207/10152 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
The invention relates to techniques for material testing of optical test pieces, for example of lenses. Angle-variable illumination, using a suitable illumination module, and/or angle-variable detection are carried out in order to create a digital contrast. The digital contrast can be, for example, a digital phase contrast. A defect detection algorithm for automated material testing based on a result image with digital contrast can be used. For example, an artificial neural network can be used.